Method and apparatus for enhanced sleep mode tiering to optimize standby time and test yield

An apparatus for optimizing the yield of tested electronic devices, comprising:

• means for characterizing a sample to derive a specification for each device of a group of tested devices;
• means for setting boundaries for the group of tested devices, wherein the voltage is optimized for power consumption;
• means for optimizing a distribution of the group of tested devices, wherein the group of tested devices is divided into sub-groups based on testing results;
• means for programming automated test equipment with a code, which code is then coded into each device in the sub-group, wherein the coding reflects the sub-group to which the device is assigned;
• means for storing the code to system software to provide values across the group of tested devices;
• and
• means for correlating the automated test equipment and the system software based on the programmed code.

A non-transitory computer-readable medium containing instructions, which when executed cause a processor to perform the steps of:

• characterizing a sample to derive a specification for each device of a group of tested devices;
• setting boundaries for the group of tested devices, wherein the voltage is optimized for power consumption;
• optimizing a distribution of the group of tested devices, wherein the group of tested devices is divided into sub-groups based on testing results;
• programming automated test equipment with a code, which code is then coded into each device in the sub-group, wherein the coding reflects the sub-group to which the device is assigned;
• storing the code to system software to provide values across the group of tested devices;
• and
• correlating the automated test equipment and the system software based on the programmed code.