Non-synchronized radio-frequency testing
AssigneeApple Inc.
InventorsWassim El-Hassan, Vishwanath Venkataraman
Life of this patent
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AssigneeApple Inc.
InventorsWassim El-Hassan, Vishwanath Venkataraman
Estimating the term…
A device under test (DUT) may be tested using a test station having a test host, a non-signaling tester, and a test cell. During testing, the DUT may be placed within the test cell, and the DUT may be coupled to the test host and the tester. In one suitable arrangement, the DUT may be loaded with a predetermined test sequence. The predetermined test sequence may configure the DUT to transmit test signals using different network access technologies without synchronizing with the tester. The tester may receive corresponding test signals and perform desired radio-frequency measurements. In another suitable arrangement, the tester may be loaded with the predetermined test sequence. The predetermined test sequence may configure the tester to generate test signals using different network access technologies without establishing a protocol-compliant data link with the DUT. The DUT may receive corresponding test signals and compute receive signal quality.
A method of testing a device under test with a test station, the method comprising:
A method of testing a device under test with a test station, the method comprising:
A method of testing a device under test with a test station, the method comprising:
Dependencies are inferred from the claim text.