Strain-balanced extended-wavelength barrier detector
AssigneeLockheed Martin Corporation
InventorsJeffrey W. Scott, George Paloczi
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AssigneeLockheed Martin Corporation
InventorsJeffrey W. Scott, George Paloczi
Estimating the term…
A strain-balanced photodetector is provided for detecting infrared light at an extended cutoff wavelength in the range of 4.5 μm or more. An InAsSb absorber layer has an Sb content is grown in a lattice-mismatched condition to a GaSb substrate, and a plurality of GaAs strain-compensating layers are interspersed within the absorber layer to balance the strain of the absorber layer due to the lattice mismatch. The strain-compensation layers allow the absorber to achieve a thickness exhibiting sufficient absorption efficiency while extending the cutoff wavelength beyond that possible in a lattice-matched state. Additionally, the strain-compensation layers are sufficiently thin to be substantially quantum-mechanically transparent such that they do not substantially affect the transmission efficiency of the absorber. The photodetector is preferably formed as a majority carrier filter photodetector exhibiting minimal dark current, and may be provided individually or in a focal plane array.
A method of forming a strain-balanced extended-wavelength majority carrier filter barrier photodetector for a desired cutoff wavelength, comprising:
A non-transitory processor readable storage medium for forming a strain-balanced extended-wavelength majority carrier filter barrier photodetector with a desired cutoff wavelength, the medium provides for an executable computer program product, the executable computer program product comprising a computer software code that, when executed on a processor, causes the processor to determine a periodic interval at which to intersperse, within a photo-absorbing region, a plurality of strain-compensating layers such that the strain-compensating layers are substantially quantum-mechanically transparent while compensating for a mechanical strain of the photo-absorbing region on at least one of a substrate and a barrier layer in a lattice-mismatched condition to allow for the photodetector to be grown by alternatingly growing on at least one of the substrate and the barrier layer a plurality of photo-absorbing layers of a first alloy and the plurality of strain-compensating layers of a second alloy at the determined periodic interval within the photo-absorbing region;
A method of forming a strain-balanced extended-wavelength photodetector, the method comprising:
A method of forming a strain-balanced extended-wavelength majority carrier filter barrier photodetector for a desired cutoff wavelength, comprising:
Dependencies are inferred from the claim text.