Method and apparatus for compensating for a parameter change in a synthetic aperture imaging system
AssigneeInstitute National D'Optique
InventorsAlain Bergeron, Linda Marchese
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Abstract
There is described a method for processing data generated by a synthetic aperture imaging system, comprising: receiving raw data representative of electromagnetic signals reflected by a target area to be imaged; receiving a parameter change for the synthetic aperture imaging system; digitally correcting the raw data in accordance with the parameter change, thereby compensating for the parameter change in order to obtain corrected data; and generating an image of the target area using the corrected data.
Claims8
A method for processing data generated by a synthetic aperture imaging system, comprising:
- receiving raw data representative of electromagnetic signals reflected by a target area to be imaged;
- receiving a parameter change causing a variation of an interference pattern parameter for said synthetic aperture imaging system, said interference pattern parameter being one of a Fresnel zone plate focal length and a Fourier slice scaling parameter;
- using a processing unit, digitally correcting said raw data in accordance with said parameter change, said correcting comprising determining a scaling factor using said parameter change and scaling said raw data in accordance with said scaling factor, thereby compensating for said parameter change in order to obtain corrected data;
- and
- generating an image of said target area using said corrected data, said generating comprising:
- generating an incident light;
- modulating said incident light in accordance with said corrected data, thereby obtaining a modulated light;
- and
- optically processing said modulated light, thereby obtaining an optical image of said target area.
A system for generating a synthetic aperture image of a target area, comprising:
- a memory configured to store raw data representative of electromagnetic signals reflected by said target area and a parameter change causing a variation of an interference pattern parameter for said synthetic aperture imaging system, said interference pattern parameter comprising one of a Fresnel zone plate focal length and a Fourier slice scaling parameter;
- a processing unit configured to determining a scaling factor using said parameter change and scaling said raw data in accordance with said scaling factor in order to compensate for said parameter change and obtain corrected data;
- and
- an image generator configured to generate an image of said target area using said corrected data, said image generator comprising:
- a light source configured to generate incident light;
- a light modulator configured to moderate said incident light in accordance with said corrected data, thereby obtaining a modulated light;
- and
- an optical processor configured to optically process said modulated light, thereby obtaining said image of said target area.
Dependencies are inferred from the claim text.