Effective-inductance-change based magnetic particle sensing
AssigneeCalifornia Institute of Technology
InventorsHua Wang, Seyed Ali Hajimiri, Yan Chen
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AssigneeCalifornia Institute of Technology
InventorsHua Wang, Seyed Ali Hajimiri, Yan Chen
Estimating the term…
The invention relates to an integrated measurement system to detect a quantity of magnetic particles in a sample. The measurement system includes a substrate. An electromagnetic (EM) structure disposed on the surface of the substrate is configured to receive a sample including the magnetic particles in proximity thereof. The integrated measurement system also includes an electrical current generator disposed on the surface of the substrate which is electro-magnetically coupled to the EM structure. The electrical current generator is configured to cause an electrical current to flow in the EM structure. The integrated measurement system also includes an effective inductance sensor disposed on the surface of the substrate which is configured to measure a selected one of an effective inductance and a change in effective inductance. The invention also relates to a method to determine the number of and/or the locations of the magnetic particles in a sample.
An integrated measurement system to detect a quantity of magnetic particles in a sample, the system comprising:
An integrated measurement system configured to detect a quantity of magnetic particles in a first sample, the system comprising:
The measurement system of 7, wherein said integrated measurement system comprises a CMOS structure.
The measurement system of 7, wherein said electrical current generator comprises a quasi-static electrical current generator.
The measurement system of 7, wherein said sensing oscillator comprises a low noise oscillator.
Dependencies are inferred from the claim text.