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US 9,176,175 B2Granted
Non-contact conductivity measurement
AssigneeInternational Business Machines Corporation
InventorOki Gunawan
Life of this patent
Estimating the term…
Abstract
A method for analyzing a material-under-test includes levitating a free-floating magnet between a material-under-test and a diamagnet and a mounted magnet, such that the diamagnet is positioned between the mounted magnet and the free-floating magnet, measuring a rotation rate of the free-floating magnet over time, and calculating at least one of a conductivity and resistivity of the material-under-test based on the measured rotation rate of the free-floating magnet over time.
Claims5
A method for analyzing a material-under-test, comprising:
- levitating a free-floating magnet between a material-under-test, a diamagnet mounted to a support structure, and a mounted magnet, such that the diamagnet is positioned between the mounted magnet and the free-floating magnet;
- rotating the free-floating magnet in a physically separated manner with respect to the material-under-test;
- measuring a rotation rate of the free-floating magnet over time with a rotation detection assembly based on measuring a reflection of a laser beam projected toward the free-floating magnet, the rotation rate increasing or decreasing based on a drag torque effect of the material-under-test on the free-floating magnet;
- and
- calculating, via a conductivity calculation unit in electrical communication with the rotation detection assembly, at least one of a conductivity and resistivity of the material-under-test based on the measured rotation rate of the free-floating magnet over time.
2 more elements
Dependencies are inferred from the claim text.