Systems and methods for simultaneously measuring forward and reverse scattering parameters
AssigneeAnritsu Corporation
InventorsDonald Anthony Bradley, Karam Michael Noujeim, Jon S. Martens
Life of this patent
Estimating the term…
Loading patent…
AssigneeAnritsu Corporation
InventorsDonald Anthony Bradley, Karam Michael Noujeim, Jon S. Martens
Estimating the term…
A system adapted to measure electrical performance of a device under test (DUT) having two or more ports includes a plurality of signal sources synchronized and configured to generated signals simultaneously, a plurality of first signal paths to obtain transmitted and reflected signals from the DUT, a plurality of second signal paths to obtain incident signals from the signal sources, and a receiver for receiving the reflected, transmitted and incident signals obtained at the first signal paths and the second signal paths. The receiver is adapted to separate the reflected and the transmitted signals obtained from each of the first signal paths. The signal sources are configured to each generate a signal having a frequency offset from each of the others of the signal sources by a known frequency delta.
A system adapted to measure electrical performance of a device under test (DUT) having two or more ports, comprising:
A method for measuring electrical performance of a device under test (DUT) having two or more ports, comprising:
A non-transitory computer readable storage medium, including instructions stored thereon which when read and executed by one or more computers cause the one or more computers to perform the steps comprising:
Dependencies are inferred from the claim text.