Method of optical analysis using reference cell and base plate correction and apparatus thereof
AssigneeARKRAY, Inc.
InventorsKoji Fujimoto, Kotaro Shinozaki, Shigeru Kitamura
Life of this patent
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AssigneeARKRAY, Inc.
InventorsKoji Fujimoto, Kotaro Shinozaki, Shigeru Kitamura
Estimating the term…
A method for analyzing a sample includes the step of irradiating a reaction portion of a sample BL and a reagent 40 in a reaction cell 34A of an analysis unit with light to obtain data D0 indicating optical characteristics of this portion. The method further includes the steps of irradiating a reference cell 34B which is not provided with a reagent 40 with light in a state in which the sample BL is supplied to the cell to obtain reference data D1 indicating optical characteristics of this portion, irradiating a base portion 34C of the analysis unit with light to obtain reference data D2 indicating optical characteristics of this portion, and obtaining data D3 indicating optical characteristics of the sample BL before reaction with the reagent 40 based on the reference data D1 and D2.
A method of analyzing a sample comprising:
An analyzer comprising:
Dependencies are inferred from the claim text.