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US 9,174,368 B2Granted
Retardation film, method of producing the same and image display device
AssigneeNitto Denko Corporation
InventorsToshiyuki Iida, Takahiro Nakai, Takashi Shimizu, Tsutomu Hani
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Abstract
The retardation film of the present invention contains at least one of an epoxy resin cured product and an epoxy (meth)acrylate resin cured product. In the retardation film of the present invention, in-plane birefringence index thereof at a wavelength of 590 nm is preferably 0.001 or more and a birefringence index in a thickness direction thereof at a wavelength of 590 nm is preferably 0.001 or more.
Claims3
A retardation film comprising:
- only one type of a resin component,
- wherein the only one type of resin component is either an epoxy resin cured product or an epoxy (meth)acrylate resin cured product,
- wherein an in-plane birefringence index of the retardation film at a wavelength of 590 nm is 0.001 or more and a birefringence index in a thickness direction thereof at a wavelength of 590 nm is 0.001 or more,
- the retardation film is a stretched film, and
- an index ellipsoid of the retardation film satisfies one of the relationships of nx>ny>nz, nx>nz>ny, or nx>ny=nz, wherein nx represents refractive index in the direction in which in-plane refractive index of the retardation film is maximum (X axial direction), ny represents refractive index in the direction orthogonal to the X axial direction in the same plane (Y axial direction), and nz represents refractive index in the direction orthogonal to the X axial direction and Y axial direction (thickness direction), and
- the in-plane birefringence index is determined from the expression:
- Δnxy [590]=nx−ny, and the birefringence index in the thickness direction is determined from the expression:
- Δnxz [590]=nx−nz.
5 more elements
Dependencies are inferred from the claim text.