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US 9,165,802 B2Granted
Methods for cleaving a bonded wafer structure
AssigneeSunEdison Semiconductor Limited (UEN201334164H)
InventorsGregory A. Young, Jeffrey L. Libbert
Life of this patent
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Abstract
Apparatus and methods for mechanically cleaving a bonded wafer structure are disclosed. The apparatus and methods involve clamps that grip the bonded wafer structure and are actuated to cause the bonded structure to cleave.
Claims10
A method of cleaving a bonded wafer structure comprising a first wafer and a second wafer, the first wafer having a peripheral edge including a first portion, the second wafer having a peripheral edge including a second portion, the first portion disposed opposite the second portion, the method comprising:
- contacting the first portion of the peripheral edge of the first wafer with a surface of an annular member of a first grasping member;
- contacting the second portion of the peripheral edge of the second wafer with a surface of an annular member of a second grasping member, wherein the annular member of the first grasping member or the annular member of the second grasping member has an actuated edge;
- actuating the actuated edge to grasp and release the first wafer or the second wafer;
- and
- cleaving the bonded wafer structure by at least one of (1) applying a force on the first wafer by actuating the first grasping member or (2) applying a force on the second wafer by actuating the second grasping member.
2 more elements
Dependencies are inferred from the claim text.