An X-ray inspection system comprising an x-ray source, a flat panel detector, a calibration phantom comprising at least one discrete geometric object, and an electronic data processing device, wherein the x-ray inspection system is adapted to record at least one x-ray image of the calibration phantom placed between the x-ray source and the flat panel detector, at least one discrete geometric shape is generated in the x-ray image by imaging the at least one discrete geometric object of the calibration phantom, the data processing device is adapted to determine a location-dependent distortion error of the flat panel detector from the at least one x-ray image on the basis of at least one characteristic of the discrete geometric shape, all of the at least one characteristics of the at least one discrete geometric shape used for determining the location-dependent distortion error are independent of the dimensions of the calibration phantom or of exactly knowing the dimensions of the calibration phantom.