Method for lithography patterning
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsShang-Chieh Chien, Shu-Hao Chang, Hsiang-Yu Chou, Ming-Chin Chien, Jui-Ching Wu, Jeng-Horng Chen
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsShang-Chieh Chien, Shu-Hao Chang, Hsiang-Yu Chou, Ming-Chin Chien, Jui-Ching Wu, Jeng-Horng Chen
Estimating the term…
A method of reducing resist outgassing for EUV lithography is disclosed. The method includes forming a material layer over a substrate wherein a top surface of the material layer contains a certain concentration of a quencher or a base. The method further includes forming a resist layer over the top surface of the material layer and exposing the resist layer to a EUV radiation for patterning. The quencher or the base underneath the resist layer acts to suppress resist outgassing during the EUV exposure. The material layer itself may serve as a hard mask layer or an anti-reflection layer for the patterning process, in addition to being the carrier of the quencher or the base. The method can be used in other types of lithography, such as e-beam lithography, for reducing resist outgassing.
A method of lithography patterning comprising:
A method of integrated circuit lithography, comprising:
A method of lithography patterning, comprising:
Dependencies are inferred from the claim text.