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US 9,128,063 B2Granted
Non-contact stress measuring device
AssigneePratt & Whitney Canada Corp.
InventorKevin Allan Dooley
Life of this patent
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Abstract
Apparatuses and methods for measuring stress or strain in a conductive material without physical contact with the material are provided. The device comprises an inductor circuit configured to induce an alternating current into the material along a first path; and a detector configured to detect a signal representative of the stress in the material along the first path when current is induced in the material.
Claims8
Apparatus for measuring stress in conductive material without physically contacting the material, the apparatus comprising:
- an inductor circuit comprising a first inductor, a second inductor, a third inductor and a fourth inductor arranged in a Wheatstone bridge configuration and configured to induce alternating current in the material along a first path, a second path, a third path and a fourth path respectively without physically contacting the material, the first path and the second path extending in different respective first and second directions;
- and
- a detector connected to the inductor circuit and configured to detect a signal representative of a differential stress in the material between the first direction and the second direction when current is induced in the material, the detector being configured to detect an unbalance in the Wheatstone bridge.
Dependencies are inferred from the claim text.