Magnetic tunnel junctions with perpendicular magnetization and magnetic random access memory
AssigneeTohoku University
InventorsHideo Ohno, Shoji Ikeda, Michihiko Yamanouchi, Hideo Sato, Katsuya Miura
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Abstract
In magnetic tunnel junctions manufactured with use of a ferromagnetic material having perpendicular magnetic anisotropy, a difference in record retention time depending on stored information due to an imbalance in thermal stability between a parallel state and an anti-parallel state of magnetization, which correspond to bit information, is alleviated. A reference layer and a recording layer which constitute a magnetic tunnel junction are made different in area from each other so as to correct the difference in record retention time corresponding to stored information.
Claims12
A magnetic tunnel junction, comprising:
- a reference layer whose magnetization direction is invariable;
- a recording layer whose magnetization direction is variable;
- and
- a nonmagnetic layer electrically connected between the reference layer and the recording layer,
- wherein
- magnetization of the reference layer and the recording layer is perpendicular to a film plane,
- the reference layer and the recording layer include a current supply terminal,
- the reference layer is larger in area than the recording layer,
- a thermal stability factor of the magnetic tunnel junction satisfies the relationship:
- EAP/kBT=E0(1−Hs/Hkrec)2/kBT≧40, and
- a magnitude of a dipole coupling magnetic field generated from the reference layer at a center of the recording layer satisfies the relationship:
- Hs=Mstref(dref/2)2/2μ0[{(dref/2)2+tbar2}3/2],
- where EAP represents an energy barrier when magnetization of the reference layer and magnetization of the recording layer are placed in anti-parallel to each other, kB represents a Boltzmann's constant, T represents absolute temperature, E0 represents an energy barrier without dipole coupling, Hkrec represents an anisotropy magnetic field of the recording layer, dref represents a diameter of a circle whose area is identical to the area of the reference layer, tref represents a film thickness of the reference layer, tbar represents a film thickness of the nonmagnetic layer, and μ0 represents a magnetic permeability under vacuum.
Dependencies are inferred from the claim text.