Circuit board having bypass pad
AssigneeSamsung Electronics Co., Ltd.
InventorsSang-Guk Han, Seok-Joon Moon, Beom-jun Jin
Life of this patent
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Abstract
An electronic device having a printed circuit board is provided. In one embodiment, the printed circuit board includes a plurality of external pads to be coupled with an external device and a plurality of bypass pads for testing an electric circuit. The external pads are exposed and at least one of the plurality of bypass pads are not exposed from an outer surface of the PCB. A system using the electronic device and a method of testing an electronic device are also provided.
Claims20
A method of forming a solid state disk (SSD) including a printed circuit board and a plurality of semiconductor devices, the printed circuit board including a plurality of bypass pads for testing the plurality of semiconductor devices including a first semiconductor device and a second semiconductor device, the method comprising:
- providing a substrate including a first surface and a second surface, the second surface of the substrate being opposite to the first surface;
- mounting a plurality of bypass pads on the second surface of the substrate;
- forming a solder resist layer on the second surface of the substrate, the solder resist layer covering the plurality of bypass pads;
- mounting the plurality of semiconductor devices on the substrate;
- electrically coupling each of the plurality of bypass pads to a respective semiconductor device;
- and
- mounting a plurality of terminal pads on the substrate.
A method of manufacturing an electronic device including a printed circuit board and one or more semiconductor devices, the printed circuit board including a plurality of bypass pads for testing the one or more semiconductor devices, the method comprising:
- providing a substrate including a first surface and a second surface, the second surface of the substrate being opposite to the first surface;
- mounting a plurality of bypass pads on the second surface of the substrate;
- forming a solder resist layer on the second surface of the substrate, the solder resist layer covering the plurality of bypass pads;
- mounting the one or more semiconductor devices on the substrate;
- electrically coupling each of the plurality of bypass pads to a respective semiconductor device;
- removing at least a portion of the solder resist layer to expose at least one bypass pad;
- and
- testing at least one of the one or more semiconductor devices through the exposed at least one bypass pad.
A method of manufacturing electronic devices, each electronic device including a printed circuit board and one or more semiconductor chips, the printed circuit board including a plurality of bypass pads for testing the one or more semiconductor chips, the method comprising:
- providing a substrate of the printed circuit board for each electronic device, the substrate including a first surface and a second surface, the second surface of the substrate being opposite to the first surface;
- mounting a plurality of bypass pads on the second surface of the substrate for each electronic device;
- forming a solder resist layer on the second surface of the substrate for each electronic device, the solder resist layer covering the plurality of bypass pads;
- mounting the one or more semiconductor chips on the substrate for each electronic device;
- electrically coupling each of the plurality of bypass pads to a respective semiconductor chip;
- selecting one or more electronic devices for testing;
- removing at least a portion of the solder resist layer to expose at least one bypass pad of each of the selected electronic devices;
- and
- testing at least one of the one or more semiconductor chips for each of the selected electronic devices through the exposed at least one bypass pad.
Dependencies are inferred from the claim text.