Latent-image measuring device and latent-image carrier
AssigneeRicoh Companmy, Limited
InventorHiroyuki Suhara
Life of this patent
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Abstract
A latent-image measuring device that measures the state of a photoconductor. The latent-image measuring device emits a charged-particle beam to the photoconductor to detects a charged-particle signal obtained through the emission of the charged-particle beam. The latent-image measuring device then exposes the photoconductor a plurality of times to form electrostatic latent images on the photoconductor, and measures an amount of change in latent-image depth while changing a time interval between a plurality of exposures.
Claims2
A latent-image carrier having a surface that is uniformly charged and exposed to form an electrostatic latent image thereon, the latent-image carrier satisfies, when the surface is exposed a plurality of times to light beams having a wavelength equal to or less than 680 nanometers,
- |ΔD/A|<0.2
- where A is a diameter of a beam spot on the surface and is equal to or less than 60 micrometers, and ΔD is a difference in latent-image diameter corresponding to the beam spot between when a time interval at which the surface is exposed is 1 microsecond and when the time interval is 1 millisecond.
Dependencies are inferred from the claim text.