Vernier photonic sensor data-analysis
AssigneesUniversiteit Gent, Imec Vzw
InventorsPeter Bienstman, Tom Claes, Wim Bogaerts
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AssigneesUniversiteit Gent, Imec Vzw
InventorsPeter Bienstman, Tom Claes, Wim Bogaerts
Estimating the term…
Quantifying a refractive index of a test medium by obtaining spectral data representative for an optical signal being modulated with an optical transfer characteristics of a photonic sensor, the modulation being obtained by combining modulation of a first electromagnetic wave component in an optical filter element with a first periodic transfer spectrum having a first free spectral range and modulation of a second electromagnetic wave component in an optical filter element with a second periodic transfer spectrum having a second free spectral range being different from the first free spectral range. A relative is change induced in the second periodic transfer spectrum by bringing the test medium in proximity with the optical filter element with the second periodic transfer spectrum. The refractive index of the test medium is quantified by determining a wavelength offset of an envelope signal in said spectral data.
A method for quantifying an effective refractive index change in a photonic sensor the method comprising the steps of:
A non-transitory computer program product for, when executing on a processing unit, quantifying an effective refractive index change in a photonic sensor by:
A processor for quantifying an effective refractive index change in a photonic sensor, the processor being programmed for determining a wavelength offset of an envelope signal in spectral data, the envelope signal having a wavelength periodicity substantially larger than a periodicity of the first periodic transfer spectrum and the second periodic transfer spectrum,
Dependencies are inferred from the claim text.