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US 9,068,946 B2Granted
Fine particle measuring apparatus
AssigneeSony Corporation
InventorNao Nitta
Life of this patent
Estimating the term…
Abstract
A fine particle measuring apparatus is provided. The fine particle measuring apparatus includes a detection unit configured to detect light emitted from a fine particle and a processing unit having a memory device storing instructions which when executed by the processing unit, cause the processing unit to calculate a corrected intensity value of the detected light and generate spectrum data based on the corrected intensity value.
Claims8
A fine particle measuring apparatus, comprising:
- a detection unit configured to detect light from a fine particle by a plurality of light-receiving elements of different detection wavelength bands;
- and
- a processing unit configured to correct an intensity value of the light obtained by the detection unit by a detection wavelength bandwidth of each of the light-receiving elements so as to calculate a first corrected intensity value.
Dependencies are inferred from the claim text.