Loading patent…
AssigneeAurora Flight Sciences Corporation
InventorsAdam Ian Nadel, Adam Scott Ehrmantraut
Estimating the term…
The present disclosure endeavors to provide an SHM system and method using a conductive material (e.g., CNT) to measure changes in a layered structure. Change in capacitance of a layered structure may be measured over time thereby indicating a change in the structural integrity of the material. The SHM system may be embedded with, or within, the layered structure such that the system is effectively part of the material. Alternatively, it may be external to the layered structure such that the system is a separate device used to measure the capacitance. The SHM system may also localize any changes in a layered structure by using, for example, strips or panels of conductive material on opposite sides of the layered structure being measured. Damage within overlapping portions of the conductive material provides localization capability where varying the size of the strips or panels may be use to vary the sensitivity and resolution of both the locations and size of the defect.
A method for detecting an amount of residual strength remaining in a layered structural component comprising the steps of:
A system for detecting an amount of residual strength remaining in a layered structural component comprising:
A system for detecting an amount of residual strength remaining in a structural component comprising:
A method for an amount of residual strength remaining in a structural component comprising the steps of:
Dependencies are inferred from the claim text.