X-ray imaging apparatus
AssigneeCanon Kabushiki Kaisha
InventorsToru Den, Kimiaki Yamaguchi, Chidane Ouchi
Life of this patent
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Abstract
An X-ray imaging apparatus comprises a grating configured to form an interference pattern by diffracting X-rays from an X-ray source, a amplitude grating configured to partly shield X-rays forming the interference pattern, and an X-ray detector configured to detect an intensity distribution of X-rays from the amplitude grating. The amplitude grating is comprised of a central area and a peripheral area and the peripheral area shows an X-ray transmittance higher than the central area relative to X-rays perpendicularly entering the amplitude grating.
Claims12
An X-ray apparatus configured to acquire information on an object, the apparatus comprising:
- a grating configured to form an interference pattern by diffracting X-rays from an X-ray source;
- an amplitude grating configured to partly shield X-rays forming the interference pattern, the amplitude grating having a plurality of shielding portions arranged therein for shielding X-rays, comprising a center, and including a central area and a peripheral area, the center being a point located on the amplitude grating where a hypothetical straight line connecting the X-ray source and the amplitude grating intersects with the amplitude grating perpendicularly thereto, the central area being an area where a distance from any point located therein to the center is smaller than a predetermined length, and the peripheral area being an area where a distance from any point located therein to the center is not smaller than the predetermined length;
- and
- an X-ray detector configured to detect an intensity distribution of X-rays from the amplitude grating,
- wherein each of the shielding portions has a thickness in the direction perpendicular to the direction of arrangement of the plurality of shielding portions, the thicknesses of the shielding portions that are arranged in the central area having a first average thickness and the thicknesses of the shielding portions that are arranged in the peripheral area having a second average thickness which is smaller than the first average thickness.
An X-ray apparatus configured to acquire information on an object, the apparatus comprising:
- a grating configured to form an interference pattern by diffracting X-rays from an X-ray source;
- an amplitude grating configured to partly shield X-rays forming the interference pattern, the amplitude grating having a plurality of shielding portions arranged therein for shielding X-rays, comprising a center, and including a central area and a peripheral area, the center being a point located on the amplitude grating where a hypothetical straight line connecting the X-ray source and the amplitude grating intersects with the amplitude grating perpendicularly thereto, the central area being an area where a distance from any point located therein to the center is smaller than a predetermined length, and the peripheral area being an area where a distance from any point located therein to the center is not smaller than the predetermined length;
- and
- an X-ray detector configured to detect an intensity distribution of X-rays from the amplitude grating,
- wherein each of the shielding portions has a width in the direction of arrangement of the plurality of shielding portions, the widths of the shielding portions that are arranged in the central area having a first average width and the widths of the shielding portions that are arranged in the peripheral area having a second average width which is smaller than the first average width.
Dependencies are inferred from the claim text.