X-ray imaging apparatus
AssigneeCanon Kabushiki Kaisha
InventorChidane Ouchi
Life of this patent
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Abstract
An X-ray imaging apparatus for imaging a subject includes a diffraction grating configured to form an interference pattern by diffracting X-ray radiation from an X-ray source, a shielding grating configured to shield part of the interference pattern, a detector configured to detect the X-ray radiation passing through the shielding grating, and a moving unit configured to change an angle between each of the diffraction grating, the shielding grating and the detector and an optical axis, wherein the detector is configured to detect the X-ray according to a change in the angle between each of the diffraction grating, the shielding grating and the detector and the optical axis.
Claims15
An X-ray imaging apparatus for imaging a subject, the X-ray imaging apparatus comprising:
- a diffraction grating configured to form an interference pattern by diffracting X-ray radiation from an X-ray source;
- a shielding grating configured to block part of the interference pattern;
- a detector configured to detect the X-ray radiation passing through the shielding grating;
- and
- a moving unit configured to change an angle of each of the diffraction grating, the shielding grating and the detector with respect to an optical axis,
- wherein the detector is configured to detect the X-ray radiation passing through the shielding grating according to a change in the angle between the optical axis and at least one of the diffraction grating, the shielding grating and the detector, and
- wherein the moving unit is configured to change a distance from each of the diffraction grating, the shielding grating and the detector to the X-ray source according to a change in the angle of each of the diffraction grating, the shielding grating and the detector with respect to the optical axis.
Dependencies are inferred from the claim text.