Integrated circuit product yield optimization using the results of performance path testing

A system for optimizing integrated circuit product yield, said system comprising:

• a memory storing parameter measurements acquired during manufacture of an integrated circuit and performance measurements acquired during post-manufacture performance path testing of selected sensitizable data paths within said integrated circuit;
• and
• at least one processor comprising the following:
• a correlator accessing said memory and determining a correlation between said parameter measurements and said performance measurements;
• and
• a process optimizer adjusting, based on said correlation, target parameter values to be used during subsequent manufacture of said integrated circuit.

A computer program product comprising a non-transitory computer-readable storage medium storing computer-readable program code, said computer-readable program code comprising instructions that, when executed by a computer, perform a method for optimizing integrated circuit product yield, said method comprising:

• accessing parameter measurements acquired during manufacture of an integrated circuit and performance measurements acquired during post-manufacture performance path testing of selected sensitizable data paths within said integrated circuit;
• determining a correlation between said parameter measurements and said performance measurements;
• and
• based on said correlation, adjusting target parameter values to be used during subsequent manufacture of said integrated circuit.