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US 9,057,679 B2Granted
Combined scatter and transmission multi-view imaging system
AssigneeRapiscan Systems, Inc.
InventorEdward James Morton
Life of this patent
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Abstract
The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.
Claims7
An X-ray inspection system for scanning an object, the inspection system comprising:
- a first X-ray source and a second X-ray source, each configured to simultaneously emit rotating X-ray beams for irradiating the object, wherein each of said X-ray beams defines a transmission path;
- a detector array comprising at least one transmission detector placed between at least two backscatter detectors, wherein each of said backscatter detectors detects backscattered X-rays emitted by the first X-ray source placed on a first side of the object and wherein the transmission detectors detects transmitted X-rays emitted by the second X-ray source placed on an opposing side of the object;
- and
- at least one controller for controlling each of the first and second X-ray sources to concurrently scan the object in a coordinated, non-overlapping, manner such that the transmission paths of each of said X-ray beams does not cross.
1 more element
Dependencies are inferred from the claim text.