Resist composition, method of forming resist pattern and compound
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsAkiya Kawaue, Takaaki Kaiho, Tsuyoshi Nakamura
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AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsAkiya Kawaue, Takaaki Kaiho, Tsuyoshi Nakamura
Estimating the term…
A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, including a base component (A) which exhibits changed solubility in a developing solution under action of acid, and a photo-decomposable quencher (D0) containing a compound represented by general formula (d0) shown below. In the formula, R1 represents a hydrocarbon group of 4 to 20 carbon atoms which may have a substituent; Y1 represents a single bond or a divalent linking group; R2 and R3 each independently represents a substituent of 0 to 20 carbon atoms other than a fluorine atom; one of R2 and R3 may form a ring with Y1; Mm+ represents an organic cation having a valency of m; and m represents an integer of 1 or more.
A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, comprising:
Dependencies are inferred from the claim text.