Circuit structure of test-key and test method thereof

A test method of a test-key, the circuit structure of the test-key comprising a plurality of transistors, a first conductive contact pad, a plurality of second conductive contact pads and a plurality of third conductive contact pads, the transistors being arranged in a matrix, the first conductive contact pad being electrically coupled to a first source/drain terminal of each of the transistors in each column of the matrix, each of the second conductive contact pads being electrically coupled to a second source/drain terminal of each of the transistors in a corresponding column of the matrix, and each of the third conductive contact pads being electrically coupled to a gate terminal of each of the transistors in a corresponding row of the matrix, the test method comprising:

• providing a plurality of driving pulses to the third conductive contact pads respectively according to a predetermined sequence, so as to turn on the transistors row-by-row, wherein the enabling periods of two adjacent driving pulses in time do not overlap;
• providing a test signal to the first conductive contact pad during a test;
• and
• reading out a plurality of output signals as test results from the second conductive contact pads when a row of the transistors is turned on, so as to perform an element-character analyzing operation accordingly.