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US 9,019,804 B1Granted
Timing loop with large pull-in range
AssigneeMarvell International Ltd.
InventorsMats Oberg, Jin Xie
Life of this patent
Estimating the term…
Abstract
Aspects of the disclosure provide a sync mark detector. The sync mark detector includes a first unit configured to decay over time a value indicating a length of a bit format, a second unit configured to compare the decayed value with a detected length of the bit format to determine a new length, and a third unit configured to detect a sync mark based on the detected length and the new length.
Claims15
A detector, comprising:
- a first circuitry configured to decay over time a value indicating a length of a bit format by subtracting a predetermined value from the value in each delay period;
- a second circuitry configured to compare the decayed value with a detected length of the bit format to determine a new length, wherein the new length is a sum of the decayed value and another value that is smaller than a threshold;
- and
- a third circuitry configured to detect a data pattern based on the detected length and the new length.
1 more element
A method, comprising:
- decaying over time a value indicating a length of a bit format by subtracting a predetermined value from the value in each delay period;
- determining a new length by comparing the decayed value with a detected length of the bit format, wherein the new length is a sum of the decayed value and another value that is smaller than a threshold;
- and
- detecting a data pattern based on the detected length and the new length.
1 more element
A circuit, comprising:
- a detector configured to detect an offset based on a data pattern detection, the detector further comprising:
- a first circuitry configured to decay over time a value indicating a length of a bit format by subtracting a predetermined value from the value in each delay period,
- a second circuitry configured to compare the decayed value with a detected length of the bit format to determine a new length, wherein the new length is a sum of the decayed value and another value that is smaller than a threshold;
- a third circuitry configured to detect a data pattern based on the detected length and the new length;
- and
- a control circuit configured to generate a clock signal responsive to the offset.
3 more elements
Dependencies are inferred from the claim text.