Method for integrating low-k dielectrics
AssigneeTokyo Electron Limited
InventorsJunjun Liu, Dorel I. Toma, Hongyu Yue
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AssigneeTokyo Electron Limited
InventorsJunjun Liu, Dorel I. Toma, Hongyu Yue
Estimating the term…
A method for treating a dielectric film on a substrate and, in particular, a method for integrating a low-k dielectric film with subsequently formed metal interconnects is described. The method includes preparing a dielectric film on a substrate, wherein the dielectric film is a low-k dielectric film having a dielectric constant less than or equal to a value of about 4. Thereafter, the method further includes performing a preliminary curing process on the dielectric film, forming a pattern in the dielectric film using a lithographic process and an etching process, removing undesired residues from the substrate, and performing a final curing process on the dielectric film, wherein the final curing process includes irradiating the substrate with ultraviolet (UV) radiation.
A method of integrating a dielectric film on a substrate, comprising:
Dependencies are inferred from the claim text.