# US 9,006,653 B2 · Electron microscope > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 9,006,653 B2 - Document ID: US9006653B2 - Status: Granted - Kind: B2 - Application number: 13/984,329 - Filed: 2012-02-27 - Published: 2013-11-28 - Granted: 2015-04-14 - Earliest claimed: 2011-02-28 - Assignees: Hitachi High-Technologies Corporation - Applicants: Hideki Tanaka; Tsuyoshi Wakuda - Inventors: Hideki Tanaka; Tsuyoshi Wakuda - Web page: https://patentgrep.com/patent/US9006653B2 ## CPC - H01J 37/04: Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement {(H01J37/32009, H01J37/32623, H01J37/3266, H01J37/32697 take precedence; electron or ion-optical systems for localised treatment of objects H01J37/3007)} - H01J 37/09: Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields - H01J 37/14: magnetic - H01J 37/16: Vessels; Containers - H01J 2237/0264: magnetic - H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H) ## Abstract Provided is an electron microscope capable of enhancing a magnetic shield function even though the structure thereof has an objective tens that projects into a sample chamber space. The electron microscope includes: an objective lens (6) which focuses an electron beam to irradiate a sample (4) with; a sample chamber (5) which forms a sample space to contain the sample (4); a sample chamber magnetic shield (7) provided inside the sample chamber (5); and an objective lens magnetic shield (8) of a tubular shape which surrounds the periphery of the objective lens (6). A first and a second hole, which face to each other in a traveling direction of the electron beam, are provided in an upper plate (10) serving as an upper wall of the sample chamber (5) and in an upper shield (9) of the sample chamber magnetic shield (7). The objective lens (6) is held inside the first hole provided in the upper plate (10). A lower end of the objective lens (6) is disposed at a position lower than a lower end of the upper plate (10), and at a position of the second hole provided in the upper shield (9) or at a position near this position. The objective lens magnetic shield (8) is positioned inside the first hole, and a lower end thereof is connected to the upper shield (9). ## Claims ### Claim 1 An electron microscope, comprising: an electron gun which generates an electron beam; a column which contains the electron gun and a lens; an objective lens which focuses the electron beam to irradiate a sample; a sample chamber which is positioned under the column and forms a sample space to contain the sample; a sample chamber magnetic shield provided inside the sample chamber; and an objective lens magnetic shield of a tubular shape which surrounds a periphery of the objective lens, wherein a first hole and a second hole, which face to each other in a traveling direction of the electron beam, are provided in an upper plate serving as an upper wall of the sample chamber and in an upper shield of the sample chamber magnetic shield, respectively, wherein the upper plate and the upper shield are separated from each other in the traveling direction by a prescribed gap, wherein the objective lens is held inside the first hole provided in the upper plate of the sample chamber, wherein a lower end of the objective lens is disposed at a position lower than a lower end of the upper plate of the sample chamber and proximate to the second hole provided in the upper shield of the sample chamber magnetic shield, wherein the sample is installed at a position facing the second hole, inside the sample chamber magnetic shield, and wherein the objective lens magnetic shield is positioned inside the first hole, extends along the prescribed gap and has a lower end that is connected to the upper shield of the sample chamber magnetic shield. ### Claim 2 (depends on 1) The electron microscope according to claim 1, wherein the sample chamber magnetic shield is disposed so that the upper shield thereof is perpendicular with respect to an irradiation direction of the electron beam. ### Claim 3 (depends on 2) The electron microscope according to claim 2, further comprising a ring-shaped member comprising a ferromagnet along the objective lens magnetic shield in a portion connecting the sample chamber magnetic shield and the objective lens magnetic shield. ### Claim 4 (depends on 1) The electron microscope according to claim 1, wherein the sample chamber magnetic shield is formed so that the upper shield thereof is in a form of a side surface of a circular cone or a polygonal cone, which is convex downwardly, with a hole in a lower end thereof. ### Claim 5 (depends on 4) The electron microscope according to claim 4, further comprising a ring-shaped member comprising a ferromagnet along the objective lens magnetic shield in a portion connecting the sample chamber magnetic shield and the objective lens magnetic shield. ### Claim 6 (depends on 1) The electron microscope according to claim 1, wherein an end of the objective lens magnetic shield proximate to the electron gun is closer to the electron gun than an end of the objective lens proximate to the electron gun. ### Claim 7 (depends on 6) The electron microscope according to claim 6 wherein the objective lens magnetic shield is configured out of a single component from an end on a side of the sample to an end on a side of the electron gun. ### Claim 8 (depends on 7) The electron microscope according to claim 7, further comprising a ring-shaped member comprising a ferromagnet along the objective lens magnetic shield in a portion connecting the sample chamber magnetic shield and the objective lens magnetic shield. ### Claim 9 (depends on 6) The electron microscope according to claim 6, wherein the objective lens magnetic shield is configured out of a plurality of components from an end on a side of the sample to an end on a side of the electron gun. ### Claim 10 (depends on 9) The electron microscope according to claim 9, further comprising a ring-shaped member comprising a ferromagnet along the objective lens magnetic shield in a portion connecting the sample chamber magnetic shield and the objective lens magnetic shield. ### Claim 11 (depends on 6) The electron microscope according to claim 6, wherein the prescribed gap is determined according to a position of a tip of the objective lens on a side of the sample. ### Claim 12 (depends on 11) The electron microscope according to claim 11, further comprising a ring-shaped member comprising a ferromagnet along the objective lens magnetic shield in a portion connecting the sample chamber magnetic shield and the objective lens magnetic shield. ### Claim 13 (depends on 6) The electron microscope according to claim 6, further comprising a ring-shaped member comprising a ferromagnet along the objective lens magnetic shield in a portion connecting the sample chamber magnetic shield and the objective lens magnetic shield. ### Claim 14 (depends on 1) The electron microscope according to claim 1, wherein the upper prescribed gap is determined according to a position of a tip of the objective lens on a side of the sample. ### Claim 15 (depends on 14) The electron microscope according to claim 14, further comprising a ring-shaped member comprising a ferromagnet along the objective lens magnetic shield in a portion connecting the sample chamber magnetic shield and the objective lens magnetic shield. ### Claim 16 (depends on 1) The electron microscope according to claim 1, further comprising a ring-shaped member comprising a ferromagnet along the objective lens magnetic shield in a portion connecting the sample chamber magnetic shield and the objective lens magnetic shield.