# US 9,003,670 B2 · System and method for measuring a workpiece relative to a common measurement coordinate system > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 9,003,670 B2 - Document ID: US9003670B2 - Status: Granted - Kind: B2 - Application number: 13/415,421 - Filed: 2012-03-08 - Published: 2013-09-12 - Granted: 2015-04-14 - Earliest claimed: 2012-03-08 - Assignees: United Technologies Corporation - Applicants: James Romanelli - Inventors: James Romanelli - Web page: https://patentgrep.com/patent/US9003670B2 ## CPC - G01B 5/008: using coordinate measuring machines - G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ## Abstract A method for inspecting a surface geometry of a workpiece includes mounting the workpiece to a measurement artifact that includes a plurality of parametric datum features. The parametric datum features may be utilized by a first inspection device and a second inspection device to establish a measurement coordinate system. The surface geometry is measured relative to the measurement coordinate system with the first inspection device to provide first measurement data. The surface geometry is also measured relative to the measurement coordinate system with the second inspection device to provide second measurement data. ## Claims ### Claim 1 A method for inspecting a surface geometry of a workpiece, comprising: mounting the workpiece to a measurement artifact comprising a plurality of parametric datum features that establish a measurement coordinate system; measuring the surface geometry relative to the measurement coordinate system with a first inspection device to provide first measurement data; measuring the surface geometry relative to the measurement coordinate system with a second inspection device to provide second measurement data; transforming the first measurement data and the second measurement data from the measurement coordinate system into a reference coordinate system to respectively provide first transformed measurement data and second transformed measurement data; respectively comparing the first transformed measurement data and the second transformed measurement data to workpiece reference data; and comparing the first measurement data with the workpiece reference data to provide a transform matrix, wherein the first measurement data is processed with the transform matrix to provide the first transformed measurement data. ### Claim 2 (depends on 1) The method of claim 1, further comprising: inspecting the plurality of parametric datum features with the first inspection device to establish the measurement coordinate system for the measuring with the first inspection device; and inspecting the plurality of parametric datum features with the second inspection device to establish the measurement coordinate system for the measuring with the second inspection device. ### Claim 3 (depends on 2) The method of claim 2, wherein the inspecting of the plurality of parametric datum features comprises establishing a primary planar datum by inspecting a first of the plurality of parametric datum features, establishing a secondary line datum by inspecting a second of the plurality of parametric datum features, and establishing a tertiary point datum by inspecting a third of the plurality of parametric datum features; and the primary planar datum, the secondary line datum and the tertiary point datum establish the measurement coordinate system. ### Claim 4 (depends on 1) The method of claim 1, wherein the measurement artifact extends vertically between a planar first end surface and a second end surface, longitudinally between a first side surface and a second side surface, and laterally between a third side surface and a fourth side surface; and a first of the plurality of parametric datum features comprises the first end surface. ### Claim 5 (depends on 4) The method of claim 4, wherein the measurement artifact further comprises a slot extending longitudinally between the first side surface and the second side surface, the slot comprising a planar first slot surface that extends vertically from a second slot surface to the first end surface, the second slot surface extending laterally from the first slot surface to the third side surface; and a second of the plurality of parametric datum features comprises the first slot surface. ### Claim 6 (depends on 5) The method of claim 5, wherein the measurement artifact further comprises a notch comprising a first notch surface, a second notch surface and a third notch surface; the first notch surface extends vertically from the first end surface to the third notch surface, and longitudinally from the first side surface to the second notch surface; the second notch surface extends vertically from the first end surface to the third notch surface, and laterally from the fourth side surface to the first notch surface; the third notch surface extends longitudinally from the first side surface to the second notch surface, and laterally from the fourth side surface to the first notch surface; and a third of the plurality of parametric datum features comprises the notch. ### Claim 7 (depends on 5) The method of claim 5, wherein the measurement artifact further comprises a substantially spherical body located adjacent to a corner between the first side surface and the fourth side surface; and a third of the plurality of parametric datum features comprises the spherical body. ### Claim 8 (depends on 4) The method of claim 4, wherein the measurement artifact further comprises a pocket that extends vertically into the first end surface to a planar workpiece mounting surface. ### Claim 9 (depends on 1) The method of claim 1, wherein the first measurement data is compared with the workpiece reference data using a best fit analysis. ### Claim 10 (depends on 1) The method of claim 1, wherein the second measurement data is processed with the transform matrix to provide the second transformed measurement data. ### Claim 11 (depends on 1) The method of claim 1, wherein the first inspection device comprises an optical white light scanning device, and the second inspection device comprises a coordinate measuring machine. ### Claim 12 (depends on 1) The method of claim 1, wherein the step of measuring the surface geometry relative to the measurement coordinate system with the second inspection device is performed subsequent to the step of measuring the surface geometry relative to the measurement coordinate system with the first inspection device. ### Claim 13 (depends on 1) The method of claim 1, wherein the first inspection device is structurally separate from the second inspective device. ### Claim 14 A method for inspecting a surface geometry of a workpiece, comprising: mounting the workpiece to a measurement artifact comprising a plurality of parametric datum features that establish a measurement coordinate system; measuring the surface geometry relative to the measurement coordinate system with a first inspection device to provide first measurement data; measuring the surface geometry relative to the measurement coordinate system with a second inspection device to provide second measurement data; and comparing the first measurement data with the workpiece reference data to provide a transform matrix, wherein the second inspection device measures the surface geometry utilizing the transform matrix. ### Claim 15 A measurement artifact for establishing a measurement coordinate system during inspection of a workpiece, comprising: a measurement artifact plate that extends vertically between a planar first end surface and a second end surface, longitudinally between a first side surface and a second side surface, and laterally between a third side surface and a fourth side surface; a slot that extends longitudinally through the artifact plate between the first side surface and the second side surface, the slot comprising a planar first slot surface that extends vertically from a second slot surface to the first end surface, the second slot surface extending laterally from the first slot surface to the third side surface; and a notch comprising a first notch surface that extends longitudinally from the first side surface to a second notch surface and vertically from the first end surface to a third notch surface, the second notch surface extending laterally from the fourth side surface to the first notch surface and vertically from the first end surface to the third notch surface, and the third notch surface extending longitudinally from the first side surface to the second notch surface and laterally from the fourth side surface to the first notch surface. ### Claim 16 (depends on 15) The measurement artifact of claim 15, wherein the first end surface establishes a primary planar datum, the first slot surface establishes a secondary line datum, and the notch establishes a tertiary point datum; and the primary planar datum, the secondary line datum and the tertiary point datum establish the measurement coordinate system. ### Claim 17 (depends on 15) The measurement artifact of claim 15, further comprising a pocket that extends vertically into the artifact plate from the first end surface to a planar workpiece mounting surface. ### Claim 18 A measurement artifact for establishing a measurement coordinate system during inspection of a workpiece, comprising: a measurement artifact plate that extends vertically between a planar first end surface and a second end surface, longitudinally between a first side surface and a second side surface, and laterally between a third side surface and a fourth side surface; a slot that extends longitudinally through the artifact plate between the first side surface and the second side surface, the slot comprising a planar first slot surface that extends vertically from a second slot surface to the first end surface, the second slot surface extending laterally from the first slot surface to the third side surface; and a substantially spherical body located adjacent a corner between the first side surface and the fourth side surface; wherein the first end surface establishes a primary planar datum, the first slot surface establishes a secondary line datum, and the spherical body establishes a tertiary point datum, and the primary planar datum, the secondary line datum and the tertiary point datum establish the measurement coordinate system.