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US 9,003,255 B2Granted
Automatic test-pattern generation for memory-shadow-logic testing
AssigneeSTMicroelectronics International N.V.
InventorNishu Kohli
Life of this patent
Estimating the term…
Abstract
An embodiment of a method for automated test pattern generation (ATPG), a system for ATPG, and a memory configured for ATPG. For example, an embodiment of a memory includes a first test memory cell, a data-storage memory cell, and a test circuit configured to enable the test cell and to disable the data-storage cell during a test mode.
Claims15
A memory, comprising:
- a first test memory array having first bit columns;
- a second test memory array having second bit columns;
- a data-storage memory array;
- a test circuit configured to enable both the first test memory array and the second test memory array and to disable the data-storage memory array during a test mode and configured to generate a pattern of logic signals at the first test memory array and the second test memory array, the pattern of logic signals including at least a first signal of first same logic values at the first test memory array and at least a second signal of second same logic values different than the first same logic values at the second test memory array;
- and
- wherein the test circuit comprises:
- selection circuitry configured to select the first signal from the first test memory array based upon a selection control signal having a first value matching the first same logic values, and to select the second signal from the second test memory array based upon the selection control signal having a second value.
4 more elements
A memory, comprising:
- a first test memory array located in a test row, the first test memory array having first bit columns and being configured to store same logic values;
- a data-storage memory array located in a data row;
- a test circuit configured to enable the first test memory array and cause the same logic values to be stored in the first test memory array and to disable the data-storage memory array during a test mode;
- a second test memory array located in the test row, the second test memory array having second bit columns and being configured to store same logic values different than the same logic values stored in the first test memory array;
- a first series of bit lines coupled to the data storage memory array and the first test memory array;
- a second series of bit lines coupled to the data storage memory array and the second test memory array;
- wherein the test circuit is configured to enable the first and second test memory arrays during the test mode and comprises selection circuitry configured to couple the first test memory array to the first series of bit lines based upon a selection control signal having a first value, and to couple the second test memory array to the second series of bit lines based upon the selection control signal having a second value.
4 more elements
A memory, comprising:
- first and second test rows;
- a first test memory array having multiple bit columns and being located in the first test row, the first test memory array configured to store same logic values;
- a second test memory array having multiple bit columns and being located in the second test row and configured to store same logic values different than the same logic values stored in the first test memory array;
- a data-storage memory array located in a data row;
- a test circuit configured to enable the first and second test memory arrays and disable the data-storage memory array during a test mode, and to cause the same logic values to be stored in the first test memory array.
2 more elements
An integrated circuit, comprising:
- a first test memory array and a second test memory array;
- a data-storage memory array;
- and
- a test circuit configured to enable the first test memory array and the second test memory array and configured to disable the data-storage memory array during a test mode and configured to generate a pattern of logic signals including at least a first signal of first same logic values at the first test memory array and at least a second signal of second same logic values different than the first same logic values at the second test memory array;
- wherein the test circuit comprises:
- selection circuitry configured to select the first signal from the first test memory array based upon a selection control signal having a first value matching the first same logic values, and to select the second signal from the second test memory array based upon the selection control signal having a second value.
3 more elements
A system, comprising:
- a first integrated circuit, including:
- a first test memory array and a second test memory array;
- a data-storage memory array;
- and
- a test circuit configured to enable the first test memory array and the second test memory array and configured to disable the data-storage memory array during a test mode and configured to generate a pattern of logic signals including at least a first signal of first same logic values at the first test memory array and at least a second signal of second same logic values different than the first same logic values at the second test memory array;
- a second integrated circuit coupled to the first integrated circuit;
- wherein the test circuit comprises:
- selection circuitry configured to select the first signal from the first test memory array based upon a selection control signal having a first value matching the first same logic values, and to select the second signal from the second test memory array based upon the selection control signal having a second value.
5 more elements
Dependencies are inferred from the claim text.