Methods and systems for testing electronic circuits

A method for testing an electronic circuit, comprising:

• initializing a system for testing an electronic circuit;
• causing the system to receive or receiving, by using a. demultiplexing circuitry in the system, at least a multiplexed signal stream comprising at least a portion of a test signal and at least a portion of an ideal response signal from a test equipment to test the electronic circuit on a semiconductor substrate, wherein
• the system does not include the test equipment from which the demultiplexing circuitry of the system is to receive the test signal, and
• causing to compare or comparing, by using a comparison circuitry, the at least the portion of the ideal response signal in the multiplexed signal stream with a system response signal that is generated by the electronic circuit in response to the at least the portion of the test signal;
• and
• causing to record or recording a comparison result of the act of causing to compare or comparing in a computer or machine readable storage medium, wherein the demultiplexing circuitry is to transmit the multiplexed signal stream and the comparison result between the test equipment and the comparison circuitry.

An apparatus for testing an electronic circuit on a semiconductor substrate, comprising:

• an electronic circuit residing on the semiconductor substrate;
• a switching circuitry that is controlled by a control signal;
• an input/output port, which is operatively connected to the switching circuitry, that is controlled by the control signal or the switching circuitry to cause the input/output port to function as either an input port or an output port, wherein
• when the apparatus undergoes normal operations of the electronic circuit, the control signal or the switching circuitry causes the input output port to act as the output port to transmit at least one output signal of the electronic circuit,
• when the apparatus undergoes testing of the electronic circuit, the control signal or the switching circuitry causes the input/output port to act as the input port to receive at least a portion of an ideal response signal from test equipment,
• the test equipment transmits a test signal to the electronic circuit for the testing and is situated external to the semiconductor substrate on which the electronic circuit is located, and;
• the input/output port comprises one or more circuit components that are used to determine a flow detection through the input/output pot and is situated on the semiconductor substrate and external to the test equipment;
• a comparison module which is to compare a system response signal generated in response to the test:
• signal with the at least the portion of the ideal response signal, wherein
• at least a part of the comparison module is located on the semiconductor substrate on which the electronic circuit to be tested is located;
• and
• a recording module which is to store comparison result in a non-transitory computer or machine readable storage medium.