Dynamic built-in self-test system
AssigneeInternational Business Machines Corporation
InventorsSteven M. Douskey, Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer
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Abstract
A method of performing a dynamic built-in self-test (BIST). The method includes performing a first test of a circuit on a semiconductor chip. The first test includes a first switch factor. The circuit during the first test is monitored with one or more sensors. A first sensor value of one or more sensors monitoring the circuit is determined. It is also determined whether the first sensor value is within a range of a programmable constant. A second switch factor is determined in response to determining that the first sensor value outside the range of the programmable constant.
Claims8
A semiconductor chip comprising:
- a dynamic built-in self-test (BIST) system comprising:
- a circuit under test (CUT), the CUT generates a first switch factor when under a test;
- one or more sensors configured to monitor one or more circuit conditions;
- an interface logic in communication with the one or more sensors, the interface logic configured to determine a sensor value and to determine whether the sensor value is within a range of a programmable constant;
- and
- a test controller in communication with the interface logic and the CUT, the test controller adapted to adjust the first switch factor of the circuit to a second switch factor when the interface logic signals that the sensor value is outside the range of the programmable constant.
Dependencies are inferred from the claim text.