Resistance change memory
OwnerMasahiro Takahashi, Akira Katayama +2inventors
InventorsMasahiro Takahashi, Akira Katayama, Dong Keun Kim, Byoung Chan Oh
Life of this patent
Estimating the term…
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OwnerMasahiro Takahashi, Akira Katayama +2inventors
InventorsMasahiro Takahashi, Akira Katayama, Dong Keun Kim, Byoung Chan Oh
Estimating the term…
According to one embodiment, a resistance change memory includes a memory cell, a sense amplifier and a global bit line. The memory cell is disposed at a location where a local bit line and a word line intersect each other. The memory cell is connected to both the local bit line and the word line. The sense amplifier reads data stored on the memory cell by supplying a read current to the memory cell. The global bit line is connected between the local bit line and the sense amplifier. The global bit line feeds the read current supplied by the sense amplifier to the local bit line. The sense amplifier charges the global bit line, before the local bit line and the global bit line are connected to each other.
A resistance change memory comprising:
A resistance change memory comprising:
Dependencies are inferred from the claim text.