Microscope and observation method
AssigneeOsaka University
InventorsKatsumasa Fujita, Shogo Kawano, Masahito Yamanaka, Satoshi Kawata
Life of this patent
Estimating the term…
Loading patent…
AssigneeOsaka University
InventorsKatsumasa Fujita, Shogo Kawano, Masahito Yamanaka, Satoshi Kawata
Estimating the term…
Provided is a microscope and an observation method which can improve spatial resolution. A microscope according to an aspect of the invention includes a laser light source (10), an objective lens (16) that focuses light from the laser light source on a sample, and a detector (22) that detects the laser light as signal light from a sample (17) when the sample (17) is irradiated with the laser light. The light is applied to the sample with an intensity changed to obtain a nonlinear region where intensities of the light and the signal light have a nonlinear relation due to occurrence of saturation or nonlinear increase of the signal light when the light has a maximum intensity, and the detector (22) detects the signal light according to the intensity of the laser light to perform observation based on a saturation component or a nonlinear increase component of the signal light.
A microscope comprising:
A microscope comprising:
A microscope comprising:
An observation method that irradiates a sample with light emitted from at least one light source and observes the sample, the method comprising:
An observation method that irradiates a sample with light emitted from at least one light source and observes the sample, the method comprising:
Dependencies are inferred from the claim text.