On-chip probe circuit for detecting faults in an FPGA
AssigneeMicrosemi SoC Corporation
InventorsJonathan W. Greene, Dirk Kannemacher, Volker Hecht, Theodore Speers
Life of this patent
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AssigneeMicrosemi SoC Corporation
InventorsJonathan W. Greene, Dirk Kannemacher, Volker Hecht, Theodore Speers
Estimating the term…
An integrated circuit includes a clock input, a first output, and a second output. A programmable pulse generator has a programmable pulse counter coupled to the clock input at least one control input for receiving count information. A fixed delay element is coupled to the programmable pulse counter. A programmable delay element is coupled to the programmable pulse counter and has at least one control input for receiving delay information. A first multiplexer is coupled to the fixed delay element, the programmable delay element and to the first output. A second multiplexer is coupled to the programmable delay element, the output of the fixed delay element and the second output.
An integrated circuit including:
Dependencies are inferred from the claim text.