TFT-LCD array substrate having a connecting device for testing twice and test method for the same

A TFT-LCD array substrate comprising:

• a display area comprising a plurality of data lines and a plurality of gate lines;
• a peripheral area located at a periphery of the display area and provided with
• a first test short bar provided with a plurality of data test lines for transmitting a test signal for the data lines in the display area;
• and
• a second test short bar provided with a gate test line for transmitting a test signal for the gate lines in the display area;
• and
• a connecting device comprising a first connection layer and a second connection layer and provided at a connection location between one of the data test lines in the first test short bar and one of the data lines in the display area, or/ and provided at a connection location between the gate test line in the second test short bar and one of the gate lines in the display area;
• wherein, the connecting device comprises:
• the first connection layer having two terminals, one terminal of the first connection layer connecting to one of the data test lines or the gate test line and the other terminal of the first connection layer connecting to the corresponding one of the data lines or one of the gate lines;
• the second connection layer disposed under the first connection layer and a portion of the second connection layer overlapping with the first connection layer in location;
• an insulating layer disposed between the first connection layer and the second connection layer;
• and
• a protection layer disposed above the first connection layer.