Method and equipment for testing semiconductor apparatuses simultaneously and continuously

A method of testing a plurality of semiconductor apparatuses, the method comprising:

• mounting a plurality of semiconductor apparatuses on a first test board of test equipment, wherein the plurality of semiconductor apparatuses include test circuits;
• loading test software to the test circuits;
• performing, by using the test circuits, self-tests on the plurality of semiconductor apparatuses based on the test software, wherein a test contact portion of the test equipment loads the test software into the test circuits of the plurality of semiconductor apparatuses on the first test board, and upon completion of the loading of the test software to the first test board, loads the test software into test circuits of a plurality of semiconductor apparatuses on a second test board by disconnecting the first test board from a test signal line and connecting the second test board to the test signal line, while the self-tests are performed on the plurality of semiconductor apparatuses on the first test board, and a time of the self-tests on the plurality of semiconductor apparatuses on the first test board is overlapped with at least a portion of a time of self-tests on the plurality of semiconductor apparatuses on the second test board;
• and
• continuously supping power from a start of the self-tests on the plurality of semiconductor apparatuses on the first test board until completion of the self-tests on a plurality of semiconductor apparatuses on a last test board.

A method, comprising:

• loading first test software into a plurality of semiconductor apparatuses disposed on a first test hoard;
• loading, upon completion of the loading of the first test software on the first test hoard, second test software into a plurality of semiconductor apparatuses disposed on a second test board by disconnecting the first test board from a test signal line and connecting the second test board to the test signal line, while the plurality of semiconductor apparatuses on the first test hoard are undergoing tests based on the first test software, and a time of the tests on the plurality of semiconductor apparatuses on the first test board is overlapped with at least a portion of a time of tests on the plurality of semiconductor apparatuses on the second test board;
• and
• continuously supplying power from a start of the tests on the plurality of semiconductor apparatuses on the first test board until completion of the tests on a plurality of semiconductor apparatuses on a last test board.