Device for the non-destructive testing of an electrically conductive structure

A device for non-destructive testing of an electrically conductive part comprising:

• an induction portion;
• a receiving portion;
• and
• processing means;
• wherein the induction portion comprises an inductor dissociated into n elementary inductors of layer type supplied at different frequencies f1, f2, . . . , fn;
• wherein the receiving portion comprises n′ magnetic receivers distributed over m columns, each column comprising at most n receivers, the magnetic receivers being connected to one another over each column, the m columns of receivers being supplied by electrical signals v1′, v2′, . . . , vm′, of frequencies fi′, f2′, . . . , fm′, zero or non-zero, each magnetic receiver being arranged under an elementary inductor, m magnetic receivers being positioned under each elementary inductor, the indices n, n′ and m being positive integers such that n>=2, 1<n′<=n*m and m>1,
• wherein the processing means comprises, for each column of receivers of row i with 1≦i≦m, means of measuring the signal at terminals of this column of receivers followed by means of demodulating this signal at the frequencies f1+f′i, f2+f′i - - - fn+f′i or f1−f′i, f2−f′i - - - fn−f′i and means of calculating the magnetic field in each of the receivers of this column, and
• wherein the magnetic receivers are directed according to an axis of sensitivity, a main direction of currents of these elementary receivers being directed according to a perpendicular axis.