A reflective and/or refractive secondary lens system for focusing sunlight onto semiconductor elements, comprising a reflector having an entrance aperture orientated towards the sunlight and an exit aperture orientated towards the semiconductor component, the reflector having a projection surrounding the reflector, and wherein the reflector has an inner surface which has at least one protective coating which consists of or comprises aluminum oxide, silicon nitride or silicon oxide, and wherein the reflector has an outer surface, wherein the outer surface of the reflector and/or the surface of the projection orientated towards the exit aperture has at least one coating which has a total emission degree εn between 0.5 and 0.95 in the wavelength range of 2,000 to 10,000 nm.