Method for fabricating semiconductor device
AssigneeWinbond Electronics Corp.
InventorWen-Yueh Jang
Life of this patent
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AssigneeWinbond Electronics Corp.
InventorWen-Yueh Jang
Estimating the term…
A method for fabricating a semiconductor device is described. A plurality of isolation structures is formed in a substrate. The isolation structures are arranged in parallel and extend along a first direction. A well of a first conductive type is formed in the substrate. A plurality of first doped regions of a second conductive type is formed in the well. Each of the first doped regions is formed between two adjacent isolation structures. A plurality of gates of the second conductive type is formed on the substrate. The gates are arranged in parallel and extend along a second direction different from the first direction. One of the first doped regions is connected to one of the gates. A plurality of second doped regions of the first conductive type is formed in the well. Each of the second doped regions is formed in the first doped regions between two adjacent gates.
A method for fabricating a semiconductor device, comprising:
Dependencies are inferred from the claim text.