Automatic analysis apparatus and automatic analysis method
AssigneeHitachi High-Technologies Corporation
InventorsHidenobu Komatsu, Katsuhiro Kambara, Tetsuji Kawahara, Kentaro Wada
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AssigneeHitachi High-Technologies Corporation
InventorsHidenobu Komatsu, Katsuhiro Kambara, Tetsuji Kawahara, Kentaro Wada
Estimating the term…
A rack buffer unit 8 serving as a sample-container switching unit is provided between a rack conveying module 4 and a rack conveying module 5 which convey racks 2 on which the sample containers 1 are mounted, and an urgent-sample loading module 7 installing a rack 2 on which a sample container 1 storing a sample desired to be preferentially analyzed is mounted is provided. The rack 2 which is in the process of sample dispensing and the rack 2 desired to be preferentially analyzed are switched from each other by the rack buffer unit 8, and the sample container 1 mounted on the rack 2 desired to be preferentially analyzed is moved to a sample dispensing position in a short period of time.
An automatic analysis apparatus comprising:
An automatic analysis method for an automatic analysis apparatus having a first sample-container loading module, a first sample-container conveying module, a sample-container storing module, a second sample-container loading module different from the first sample-container loading module, a second sample-container conveying module, a sample-container switching module which is disposed before a sample dispensing position between the first sample-container conveying module and the second sample-container conveying module, and a third sample-container conveying module connected to the sample-container switching module, the automatic analysis method comprising:
Dependencies are inferred from the claim text.