Fluorine-containing sulfonic acid salts, photo-acid generator and resist composition and pattern formation method utilizing same
AssigneeCentral Glass Company, Limited
InventorsRyozo Takihana, Satoru Narizuka
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AssigneeCentral Glass Company, Limited
InventorsRyozo Takihana, Satoru Narizuka
Estimating the term…
A resist composition according to the present invention includes at least a base resin, a photoacid generator and a solvent, wherein the photoacid generator comprises a fluorine-containing sulfonic acid salt of the following general formula (4). In the formula, X independently represents a hydrogen atom or a fluorine atom; n represents an integer of 1 to 6; R1 represents a hydrogen atom, or an alkyl, alkenyl, oxoalkyl, aryl or aralkyl group; any of hydrogen atoms on carbons in R1 may be substituted with a substituent; R2 represents RAO or RBRCN; and A represents a divalent group. This fluorine-containing sulfonic acid salt can serve as a photoacid generator having high solubility in a resist solvent and thus can suitably be used for a resist composition such that the resist composition shows high resolution, wide DOF, small LER and high sensitivity to form a good pattern shape in lithographic processes.
A resist composition comprising at least a base resin, a photoacid generator and a solvent, wherein the photoacid generator comprises a fluorine-containing sulfonic acid salt of the following general formula (4):
A fluorine-containing sulfonic acid salt of the following general formula (4):
Dependencies are inferred from the claim text.