Protective thin films for use during fabrication of semiconductors, MEMS, and microstructures
AssigneeApplied Microstructures, Inc.
InventorsJeffrey D. Chinn, Boris Kobrin, Romuald Nowak
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AssigneeApplied Microstructures, Inc.
InventorsJeffrey D. Chinn, Boris Kobrin, Romuald Nowak
Estimating the term…
A method of protecting a substrate during fabrication of semiconductor, MEMS devices. The method includes application of a protective thin film which typically has a thickness ranging from 3 angstroms to about 1,000 angstroms, wherein precursor materials used to deposit the protective thin film are organic-based precursors which include at least one fluorine-comprising functional group at one end of a carbon back bone and at least one functional bonding group at the opposite end of a carbon backbone, and wherein the carbon backbone ranges in length from 4 carbons through about 12 carbons. In many applications at least a portion of the protective thin film is removed during fabrication of the devices.
A method of protecting a semiconductor substrate during separation of individual devices from said substrate, wherein said method employs a thin film coating having a thickness ranging from about 3 angstroms to about 1,000 angstroms, wherein precursor materials used to deposit said coatings are organic-based precursors which include at least one fluorine-comprising functional group at one end of a carbon back bone and at least one functional bonding group at the opposite end of a carbon backbone, wherein said carbon backbone ranges in length from 4 carbons to about 12 carbons, and wherein a surface of said thin film coating is treated with a fluid to remove debris therefrom, the debris having accumulated during said separation of individual devices from said substrate.
A method of protecting a substrate during fabrication of semiconductor or MEMS devices, the method comprising:
A method of protecting a semiconductor or MEMS substrate during packaging, comprising:
Dependencies are inferred from the claim text.