Methods of calibrating X-ray detectors
AssigneesSamsung Electronics Co., Ltd., Pusan National University Industry-University Cooperation Foundation
InventorsChae-hun Lee, Jae-chul Park, Young Kim, Ho Kyung Kim, Dae-kun Yoon
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Abstract
A method of calibrating a first threshold voltage that is a reference of X-ray detection for each unit cell of a plurality of unit cells of an X-ray detector may comprise detecting an X-ray by using a plurality of second threshold voltages for each of a plurality of X-rays having spectra at different energy levels; determining a correspondence relationship between energies having a maximum intensity in the spectra of X-rays and third threshold voltages at which a maximum number of photons having a same energy intensity are detected; and/or calibrating the first threshold voltage based on the determined correspondence relationship.
Claims15
A method of calibrating a first threshold voltage that is a reference of X-ray detection for each unit cell of a plurality of unit cells of an X-ray detector, the method comprising:
- detecting an X-ray by using a plurality of second threshold voltages for each of a plurality of X-rays having spectra at different energy levels;
- determining a correspondence relationship between energies having a maximum intensity in the spectra of X-rays and third threshold voltages at which a maximum number of photons having a same energy intensity are detected;
- and
- calibrating the first threshold voltage based on the determined correspondence relationship.
Dependencies are inferred from the claim text.