Storage device and memory controller
AssigneeHitachi, Ltd.
InventorsMasataka Nishi, Ryo Fujita, Ryoichi Inada, Takuma Nishimura, Masahiro Shiraishi, Koji Matsuda
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AssigneeHitachi, Ltd.
InventorsMasataka Nishi, Ryo Fujita, Ryoichi Inada, Takuma Nishimura, Masahiro Shiraishi, Koji Matsuda
Estimating the term…
Disclosed is a storage device using non-volatile semiconductor memory that achieves high performance and long life for the device. When managing the non-volatile semiconductor memory (2), physical blocks are classified into three types: scratch blocks (22), data blocks (23), and erased blocks (24). Data writing from a host device (3) is performed on the scratch blocks. When the number of empty pages within a scratch block becomes less than a predetermined number or no longer exists, the block is treated thereafter as a data block, and one of the erased blocks is newly assigned as a scratch block. If there are insufficient erased blocks, a block with relatively less valid data is selected from among the data blocks. After copying all valid data included in the block to a scratch block, the block is erased, and thus an erased block is acquired.
A storage device, comprising:
A memory controller performing a read processing and a write processing from and to a non-volatile semiconductor memory and a read processing and a write processing from and to a memory thereof, based on an instruction from an external system,
Dependencies are inferred from the claim text.