Testing framework for control devices

A system for testing computing devices, comprising:

• a client application component for generating control instructions for a device under test, wherein the control instructions comprise instructions directed to causing at least one change in at least one operating state of the device when processed by the device;
• and
• a testing component for obtaining the generated control instructions from the client application component, transmitting the control instructions to the device under test, and obtaining at least one output signal generated by the device under test, wherein the at least one output signal generated by the device under test is responsive to the control instructions;
• wherein device performance is assessed based on an analysis of the generated control instructions and the at least one output signal generated by the device under test to determine whether the device under test has entered a fault state, wherein whether the device under test has entered the fault state is determined when at least an attribute of the at least one output signal corresponds to an indication of an expected change in the at least one operating state of the device.

A method for testing comprising:

• obtaining at least one control instruction, wherein the at least one control instruction is generated for a device under test, and wherein the at least one control instruction comprises an instruction directed to causing at least one change in at least one operating state of the device when processed by the device;
• transmitting the at least one control instruction to the device under test;
• obtaining at least one output signal from the device under test, wherein the at least one output signal is generated in response to the at least one control instruction;
• and
• assessing a fault state response to the at least one control instruction of the device under test, wherein the fault state of the device is assessed when at least an attribute of the at least one output signal corresponds to an indication of an expected change in the at least one operating state of the device.