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US 8,947,946 B2Granted
Leakage measurement systems
AssigneeMicron Technology, Inc.
InventorShigekazu Yamada
Life of this patent
Estimating the term…
Abstract
Described examples include leakage measurement systems and methods for measuring leakage current between a word line at a boosted voltage and a word line at a supply voltage. The boosted voltage may be generated by charge pump circuitry. Examples of leakage measurement systems described herein may be included in memory devices.
Claims23
An apparatus comprising:
- charge pump circuitry configured to provide a boosted voltage to a word line of a plurality of word lines;
- measurement enable circuitry configured to provide a supply voltage to another word line of the plurality of word lines;
- a current source configured to provide a reference current to the other word line of the plurality of word lines;
- a comparator having a first input coupled to the other word line and a second input configured to receive the supply voltage, wherein the comparator is configured to generate a signal indicative of a comparison between the supply voltage and a voltage on the other word line.
1 more element
An apparatus comprising:
- a current generation circuit configured to provide a reference current to at least one of a plurality of measurement enable circuits, wherein a measurement enable circuit of the plurality of measurement enable circuits is configured to provide the reference current to at least one of a plurality of word lines;
- a plurality of comparing circuits, each comparing circuit of the plurality of comparing circuits having a first input coupled to a respective measurement enable circuit of the plurality of measurement enable circuits and a second input coupled to receive a supply voltage, and being configured to provide a signal at an output indicative of a comparison between the supply voltage and a voltage on a respective word line of the plurality of word lines.
An apparatus comprising:
- charge pump circuitry configured to provide a boosted voltage to a word line of a plurality of word lines, the boosted voltage being a higher voltage than a supply voltage;
- a current source configured to be coupled between the supply voltage and a reference voltage, the current source to provide a reference current to another word line of the plurality of word lines;
- and
- a comparator having a first input coupled to receive the supply voltage and a second input coupled to the other word line of the plurality of word lines, wherein the comparator is configured to generate a signal indicative of a comparison between the supply voltage and a voltage on the other word line.
1 more element
Dependencies are inferred from the claim text.