Reference voltage generation circuit
AssigneeSeiko Instruments Inc.
InventorHideo Yoshino
Life of this patent
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AssigneeSeiko Instruments Inc.
InventorHideo Yoshino
Estimating the term…
Provided is a reference voltage generation circuit that has a flat temperature characteristic even when there are fluctuations in manufacturing step. After a semiconductor manufacturing process is finished, electrical characteristics of a semiconductor device are evaluated. Temperature characteristic of each reference voltage (VREF) of three unit reference voltage generation circuits (10) is evaluated. Then only a unit reference voltage generation circuit (10) having the most flat temperature characteristics is selected from among the three unit reference voltage generation circuits (10). Only fuses (13, 14) of the selected unit reference voltage generation circuit (10) are not cut, but other fuses (13, 14) are cut. Accordingly only the selected unit reference voltage generation circuit (10) operates, and the other unit reference voltage generation circuits (10) do not operate.
A reference voltage generation circuit mounted on a semiconductor device, for generating a reference voltage,
A reference voltage generation circuit mounted on a semiconductor device, for generating a reference voltage,
A reference voltage generation circuit mounted on a semiconductor device, for generating a reference voltage,
Dependencies are inferred from the claim text.