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US 8,947,132 B2Granted
Semiconductor device and semiconductor system including the same
AssigneeSK hynix Inc.
InventorChoung-Ki Song
Life of this patent
Estimating the term…
Abstract
A semiconductor device includes a normal code generation unit capable of generating a normal code, a test code output unit capable of storing a plurality of preliminary test codes to output a test code in response to a test control signal, and a reference voltage generation unit capable of generating a normal reference voltage in a normal operation mode and generating a test reference voltage in a test operation mode in response to the normal code and the test code.
Claims20
A semiconductor device comprising:
- a normal code generation unit capable of generating a normal code;
- a test code output unit capable of storing a plurality of preliminary test codes to output a test code in response to a test control signal;
- and
- a reference voltage generation unit capable of generating a normal reference voltage in a normal operation mode and generating a test reference voltage in a test operation mode in response to the normal code and the test code.
1 more element
A semiconductor device comprising:
- a normal code generation unit capable of generating a normal code;
- a normal voltage generation unit capable of generating a normal voltage based on the normal code;
- a test voltage generation unit capable of generating a test voltage in response to a test control signal;
- and
- a multiplexer capable of outputting the test voltage as a test reference voltage in response to a test mode signal activated during a test operation mode and capable of outputting the normal voltage as a normal reference voltage in response to the test mode signal inactivated during a normal operation mode.
2 more elements
A semiconductor system comprising:
- a controller capable of providing an MRS code and a test control signal to a semiconductor device;
- and
- the semiconductor device capable of generating a normal reference voltage in response to the MRS code in a normal operation mode and capable of generating a test reference voltage in response to the test control signal in a test operation mode irrespective of whether an MRS setting operation is performed or not.
Dependencies are inferred from the claim text.