Switching apparatus and test apparatus
AssigneeAdvantest Corporation
InventorItaru Yamanobe
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AssigneeAdvantest Corporation
InventorItaru Yamanobe
Estimating the term…
Provided is a switching apparatus that switches a connection state between two terminals, comprising a switch that switches the connection state between the two terminals according to a control voltage supplied thereto; a driving section that provides the switch with the control voltage corresponding to a control signal supplied thereto; and a changing section that changes the control voltage output from the driving section, according to a designated switching time. The changing section may change power supplied as a power supply to the driving section, according to the designated switching time. The changing section may change the control voltage output from the driving section prior to switching of the switch.
A switching apparatus that switches a connection state between a first terminal and a second terminal, the apparatus comprising:
A test apparatus that tests a device under test, comprising:
A method of switching a connection state between a first terminal and a second terminal of a switch, comprising:
Dependencies are inferred from the claim text.
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1. Technical Field
The present invention relates to a switching apparatus and a test apparatus.
2. Related Art
FIG. 1 shows an exemplary configuration of a switching apparatus 10.
FIG. 2A shows waveforms of the voltage Vgs applied to the gate-source junction of the FET 20 by the driving section 30, and FIG. 2B shows waveforms of the drain-source junction voltage Vds of the FET 20 when the voltage Vgs waveforms shown in FIG. 2A are applied.
FIG. 3 shows a configuration of a test apparatus 100 for testing a device under test 200.
Hereinafter, some embodiments of the present invention will be described. The embodiments do not limit the invention according to the claims, and all the combinations of the features described in the embodiments are not necessarily essential to means provided by aspects of the invention.
FIG. 1 shows an exemplary configuration of a switching apparatus 10. The switching apparatus 10 includes a field-effect transistor (FET) 20, a driving section 30, a first power supply section 32, a changing section 40, a control signal input terminal 50, a first terminal 60, a second terminal 70, a timing adjusting section 90, and a calibration section 95. The switching apparatus 10 switches a connection state between the first terminal 60 and the second terminal 70, according to a switch control signal input to the control signal input terminal 50. In the example of FIG. 1, a voltage source 400 is connected to the first terminal 60 and a load 500 is connected to the second terminal 70. The switching apparatus 10 switches whether the voltage source 400 and the load 500 are connected to each other.
The FET 20 is an example of a switch. The FET 20 may be a MOSFET. The gate terminal of the FET 20 is connected to an output terminal of the driving section 30. The drain terminal of the FET 20 is connected to the first terminal 60. The source terminal of the FET 20 is connected to the second terminal 70.
From the US filing history. Foreign family members aren’t listed.
Electronic switching or gating, i.e. not by contact-making and –breaking: modifications for introducing a time delay before switching
Features relating to contacting the IC under test, e.g. probe heads; chucks: interfaces, e.g. between probe and tester
Pulse technique
Measuring electric variables
About 4 years 6 months of term left · ends 4 May 2031 (estimated)